Nanoscience Instruments, in conjunction with Fastmicro, has come up with an innovative partnership that promises to deliver an integrated solution offering a combination of fast surface particle screening with advanced particle characterization. This solution will be instrumental in assisting manufacturers to better manage contamination problems and carry out root cause investigations more quickly and efficiently. The combination offers an answer to the problems faced by the semiconductor industry, the automotive industry, the aerospace industry, the medical device industry, precision engineering industry and advanced electronics industry. These industries require an efficient solution that detects particles, counts them, measures their size, and creates a map of them. Particles detected using this system can then be examined using the Phenom Desktop SEM. This is done using Energy Dispersive X-ray Spectroscopy (EDS).
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“Organizations are under increasing pressure to identify contamination sources quickly and implement corrective actions that improve product quality and process performance,” said Sebastian Kossek, Ph.D., co-Chief Executive Officer at Nanoscience Instruments. “Our partnership with Fastmicro brings together two highly complementary technologies that help users accelerate particle investigations while gaining deeper insight into the nature and origin of contamination.” “Developments in AI, advanced packaging, and compound semiconductors are becoming increasingly sensitive to particle contamination,” said Bart Dirkx, CTO at Fastmicro. “Fastmicro is dedicated to developing solutions that quantify surface particle cleanliness in a fast, repeatable, and reliable manner. By partnering with Nanoscience Instruments, we provide customers with not only rapid particle quantification, but also accelerated particle characterization to support better decision-making and more effective contamination-control strategies.”